Centralized fusion scanning strategy for OLED-on-silicon microdisplay

A novel scanning strategy-centralized fusion (CF) scanning is proposed to address the visual perception issues encountered in OLED-on-silicon microdisplay driven digitally, especially the dynamic false contour(DFC) and flickering phenomena. This strategy incorporates the concepts of grayscale weight redistribution and the integration of subfields. It improves the quality of display images by reallocating the number and weights of integer subfields, and by positioning the integrated subfield at the midpoint of the modulation cycle. Experimental results indicate that the CF scanning approach achieves an approximate 13% increase in peak signal-to-noise ratio and a 10% reduction in mean square error compared to traditional scanning methods. Moreover, the structural similarity index score approaches 1, significantly surpassing existing scanning techniques. CF scanning outperforms the 19-subfield scanning method in JEITA flicker assessment, with a reduction in flicker quantification value by about 22%. The CF strategy offers an effective solution for enhancing the image display quality of digital -drive OLED-on-silicon microdisplay, paving the way for future research and innovation in display technology.