A simple scheme to amplify inter-class discrepancy for improving few-shot fine-grained image classification

被引:2
|
作者
Li, Xiaoxu [1 ]
Guo, Zijie [1 ]
Zhu, Rui [2 ]
Ma, Zhanyu [3 ]
Guo, Jun [3 ]
Xue, Jing-Hao [4 ]
机构
[1] Lanzhou Univ Technol, Sch Comp & Commun, Lanzhou 730050, Peoples R China
[2] City Univ London, Fac Actuarial Sci & Insurance, Bayes Business Sch, London EC1Y 8TZ, England
[3] Beijing Univ Posts & Telecommun, Sch Artificial Intelligence, Pattern Recognit & Intelligent Syst Lab, Beijing 100876, Peoples R China
[4] UCL, Dept Stat Sci, London WC1E 6BT, England
基金
中国国家自然科学基金; 北京市自然科学基金;
关键词
Few-shot learning; Fine-grained image classification; Metric-based methods; ALIGNMENT; NETWORK;
D O I
10.1016/j.patcog.2024.110736
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Few-shot image classification is a challenging topic in pattern recognition and computer vision. Few-shot finegrained image classification is even more challenging, due to not only the few shots of labelled samples but also the subtle differences to distinguish subcategories in fine-grained images. A recent method called task discrepancy maximisation (TDM) can be embedded into the feature map reconstruction network (FRN) to generate discriminative features, by preserving the appearance details through reconstructing the query image and then assigning higher weights to more discriminative channels, producing the state-of-the-art performance for few-shot fine-grained image classification. However, due to the small inter-class discrepancy in fine-grained images and the small training set in few-shot learning, the training of FRN+TDM can result in excessively flexible boundaries between subcategories and hence overfitting. To resolve this problem, we propose a simple scheme to amplify inter-class discrepancy and thus improve FRN+TDM. To achieve this aim, instead of developing new modules, our scheme only involves two simple amendments to FRN+TDM: relaxing the inter-class score in TDM, and adding a centre loss to FRN. Extensive experiments on five benchmark datasets showcase that, although embarrassingly simple, our scheme is quite effective to improve the performance of few-shot fine-grained image classification. The code is available at https://github.com/Airgods/AFRN.git.
引用
收藏
页数:9
相关论文
共 50 条
  • [1] Task Discrepancy Maximization for Fine-grained Few-Shot Classification
    Lee, SuBeen
    Moon, WonJun
    Heo, Jae-Pil
    2022 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR 2022), 2022, : 5321 - 5330
  • [2] Few-Shot Fine-Grained Image Classification via GNN
    Zhou, Xiangyu
    Zhang, Yuhui
    Wei, Qianru
    SENSORS, 2022, 22 (19)
  • [3] Few-Shot Fine-Grained Image Classification: A Comprehensive Review
    Ren, Jie
    Li, Changmiao
    An, Yaohui
    Zhang, Weichuan
    Sun, Changming
    AI, 2024, 5 (01) : 405 - 425
  • [4] Power Normalizations in Fine-Grained Image, Few-Shot Image and Graph Classification
    Koniusz, Piotr
    Zhang, Hongguang
    IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE, 2022, 44 (02) : 591 - 609
  • [5] A few-shot fine-grained image recognition method
    Wang, Jianwei
    Chen, Deyun
    BULLETIN OF THE POLISH ACADEMY OF SCIENCES-TECHNICAL SCIENCES, 2023, 71 (01)
  • [6] Few-Shot Learning for Domain-Specific Fine-Grained Image Classification
    Sun, Xin
    Xv, Hongwei
    Dong, Junyu
    Zhou, Huiyu
    Chen, Changrui
    Li, Qiong
    IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2021, 68 (04) : 3588 - 3598
  • [7] An Unbiased Feature Estimation Network for Few-Shot Fine-Grained Image Classification
    Wang, Jiale
    Lu, Jin
    Yang, Junpo
    Wang, Meijia
    Zhang, Weichuan
    SENSORS, 2024, 24 (23)
  • [8] Transformer-Based Few-Shot and Fine-Grained Image Classification Method
    Lu, Yan
    Wang, Yangping
    Wang, Wenrun
    Computer Engineering and Applications, 2023, 59 (23) : 219 - 227
  • [9] Fine-Grained Few-Shot Image Classification Based on Feature Dual Reconstruction
    Liu, Shudong
    Zhong, Wenlong
    Guo, Furong
    Cong, Jia
    Gu, Boyu
    ELECTRONICS, 2024, 13 (14)
  • [10] Variational Feature Disentangling for Fine-Grained Few-Shot Classification
    Xu, Jingyi
    Le, Hieu
    Huang, Mingzhen
    Athar, ShahRukh
    Samaras, Dimitris
    2021 IEEE/CVF INTERNATIONAL CONFERENCE ON COMPUTER VISION (ICCV 2021), 2021, : 8792 - 8801