A framework for general-purpose microscopic image analysis via self-supervised learning

被引:1
|
作者
Zheng, Zhiwei [1 ]
Yue, Xuezheng [1 ]
Wang, Jincheng [2 ,3 ]
Hou, Juan [1 ]
机构
[1] Univ Shanghai Sci & Technol, Sch Mat Sci & Engn, 516 Jungong Rd, Shanghai 200082, Peoples R China
[2] Univ Melbourne, Dept Mech Engn, Parkville, Vic 3010, Australia
[3] Univ Western Australia, Sch Engn, M050, 35 Stirling Highway Crawley, Perth, WA 6009, Australia
关键词
Quantitative microscopic analysis; Electron microscope; Optical microscope; Unsupervised learning; Image segmentation;
D O I
10.1016/j.matchar.2024.114003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Combining materials science, artificial intelligence (AI) offers great potential for the extensive quantitative analysis and processing of material characterization associated with high-throughput experiments. However, due to the complex and diverse morphology of structural components, the development of AI models requires substantial annotation and models are usually task-specific with limited generalizability to different clinical applications. Here, we present a universal self-supervised learning framework for microscopic images. Our framework learns generalizable representations from unlabelled images and provides a pixel-wise segmentation for quantitative microstructure analysis in a variety of materials science applications. Specifically, the framework learns feature from a single image by means of self-supervised learning, and adapts it to a series of related tasks. We show that our method consistently outperforms several comparisons supervised or weakly supervised learning models in the context of various applications. Our approach provides a generalizable solution to improve model performance and alleviate the annotation workload of experts to enable practical AI applications from microscopic imaging.
引用
收藏
页数:13
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