Deep Learning Electromagnetic Inversion Solver Based on a Two-Step Framework for High-Contrast and Heterogeneous Scatterers

被引:2
|
作者
Yao, He Ming [1 ]
Ng, Michael [2 ]
Jiang, Lijun [3 ]
机构
[1] Imperial Coll London, Dept Mat, London SW7 2BX, England
[2] Hong Kong Baptist Univ, Dept Math, Hong Kong, Peoples R China
[3] Univ Hong Kong, Dept Elect & Elect Engn, Hong Kong, Peoples R China
关键词
Convolutional neural network; electromagnetic (EM) inverse scattering; high contrast; residual learning; two-step process; TROPOSPHERIC TURBULENCE; SENSITIVITY-ANALYSIS; GLOBAL SENSITIVITY; PROPAGATION FACTOR; SURFACE; SIMULATION; SPECTRA;
D O I
10.1109/TAP.2024.3372772
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This communication proposes a novel electromagnetic (EM) inversion solver based on a two-step deep learning (DL) framework. The framework consists of the deep convolutional asymmetric encoder-decoder structure (DCAEDS) followed by the deep residual convolutional neural network (DRCNN). In the first step, DCAEDS utilizes EM scattered field data from a single-frequency one-time measurement to coarsely retrieve the initial contrasts (permittivities) of target scatterers. In the second step, DRCNN employs a mixed input scheme, comprising the initially reconstructed permittivities from the first step and the original EM scattered field data, to significantly improve the retrieved contrasts (permittivities) and refine the reconstruction of targets. Consequently, the proposed EM inversion solver achieves excellent accuracy and efficiency, even for high-contrast targets. The proposed solver is flexible as it is required only for a single-frequency one-time measurement on the EM scattered field. Moreover, the proposed two-step DL-based solver overcomes the limitations of conventional methods, such as high computational costs and ill-posedness. Numerical benchmarks based on various dielectric objects demonstrate the feasibility of the proposed EM inversion solver, highlighting its potential as a candidate for real-time quantitative EM inversion for high-contrast targets.
引用
收藏
页码:5337 / 5342
页数:6
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