Adaptive light intensity aided wavelength tuning for phase-shifting interferometric measurement system

被引:0
|
作者
Lu, Qingjie [1 ]
Wang, Ji [1 ]
Liu, Wenjing [1 ]
Liu, Chang [1 ]
机构
[1] Guangdong Ocean Univ, Sch Elect & Informat Engn, Zhanjiang 524088, Guangdong, Peoples R China
关键词
phase-shifting interferometric; self-adaptive; wavelength tuning; DESIGN;
D O I
10.1002/mop.34208
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In phase-shifting interferometric measurement system, using wavelength-tuned phase-shifting technology to measure optical surface can improve vibration errors. However, the wavelength-tuned phase-shifting interferometry is greatly challenged by nonlinear distortion between wavelength-tuned light intensity and voltage modulation, which has a certain impact on phase calculation accuracy. To address this issue, an adaptive light intensity-aided interferometric measurement scheme is proposed in this study. To improve the adjustment time of voltage response, an improved fuzzy single-neuron adaptive proportional differential integral constant amplitude control algorithm is built. By exploiting the online detection and feedback control of light intensity, the stable output of light intensity is integrated into phase-shifting measurement system. Experiment results verify that the improvement of light intensity fluctuation range, root mean square, and peak-to-valley measurement repeatability can be achieved with the proposed scheme.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Phase-Shifting Interferometric Profilometry with a Wavelength-Tunable Diode Source
    Takahashi, Takeshi
    Ishii, Yukihiro
    Onodera, Ribun
    OPTICAL REVIEW, 2014, 21 (03) : 410 - 414
  • [2] Phase-shifting interferometric profilometry with a wavelength-tunable diode source
    Takeshi Takahashi
    Yukihiro Ishii
    Ribun Onodera
    Optical Review, 2014, 21 : 410 - 414
  • [3] Phase-shifting interferometric measurements using infrared laser light
    Martin, E.
    Lazaro, J.L.
    Gardel, A.
    Mataix, C.
    Informacion Tecnologica, 2001, 12 (03): : 159 - 164
  • [4] Calibration method of the phase-shifting error for the topography measurement utilizing white light interferometric microscopy
    Zhang C.
    Yuan Q.
    Zhang J.
    Ji Y.
    Gao Z.
    Yan J.
    Hongwai yu Jiguang Gongcheng/Infrared and Laser Engineering, 2022, 51 (07):
  • [5] Interferometric thickness measurement of glass plate by phase-shifting analysis using wavelength scanning with elimination of bias phase error
    Sungtae Kim
    Yangjin Kim
    Sung-Chul Shin
    Kenichi Hibino
    Naohiko Sugita
    Optical Review, 2021, 28 : 48 - 57
  • [6] Interferometric thickness measurement of glass plate by phase-shifting analysis using wavelength scanning with elimination of bias phase error
    Kim, Sungtae
    Kim, Yangjin
    Shin, Sung-Chul
    Hibino, Kenichi
    Sugita, Naohiko
    OPTICAL REVIEW, 2021, 28 (01) : 48 - 57
  • [7] Phase-shifting via wavelength tuning in very large aperture interferometers
    Deck, LL
    Soobitsky, JA
    OPTICAL MANUFACTURING AND TESTING III, 1999, 3782 : 432 - 442
  • [8] Design of a Phase-shifting Algorithm for Interferometric Measurement of Optical Thickness Variation
    Bae, Wonjun
    Kim, Yangjin
    PHOTONIC INSTRUMENTATION ENGINEERING VII, 2020, 11287
  • [9] 500-mm-aperture wavelength-tuning phase-shifting interferometer
    Chai, LQ
    Xu, Q
    Yu, YJ
    Deng, Y
    Xu, JC
    Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 : 589 - 596
  • [10] 500-mm-aperture wavelength-tuning phase-shifting interferometer
    Chai, LQ
    Xu, Q
    Deng, Y
    Cheng, GP
    Xu, JC
    Shi, QK
    2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES: OPTICAL TEST AND MEASUREMENT TECHNOLOGY AND EQUIPMENT, PTS 1 AND 2, 2006, 6150