TCE: A Test-Based Approach to Measuring Calibration Error

被引:0
|
作者
Matsubara, Takuo [1 ,2 ]
Tax, Niek [3 ]
Mudd, Richard [3 ]
Guy, Ido [3 ]
机构
[1] Alan Turing Inst, London, England
[2] Newcastle Univ, Newcastle Upon Tyne, England
[3] Meta Platforms Inc, Menlo Pk, CA USA
来源
基金
英国工程与自然科学研究理事会;
关键词
FRAUD DETECTION;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
This paper proposes a new metric to measure the calibration error of probabilistic binary classifiers, called test-based calibration error (TCE). TCE incorporates a novel loss function based on a statistical test to examine the extent to which model predictions differ from probabilities estimated from data. It offers (i) a clear interpretation, (ii) a consistent scale that is unaffected by class imbalance, and (iii) an enhanced visual representation with respect to the standard reliability diagram. In addition, we introduce an optimality criterion for the binning procedure of calibration error metrics based on a minimal estimation error of the empirical probabilities. We provide a novel computational algorithm for optimal bins under bin-size constraints. We demonstrate properties of TCE through a range of experiments, including multiple real-world imbalanced datasets and ImageNet 1000.
引用
收藏
页码:1390 / 1400
页数:11
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