Alternative data evaluation methodology for infrared thermography analogous to the Shock Response Spectrum analysis method

被引:0
|
作者
Yagdjian, Harutyun [1 ]
Gurka, Martin [1 ]
机构
[1] Leibniz Inst Verbundwerkstoffe GmbH, Erwin Schrodinger Str 58, D-67663 Kaiserslautern, Germany
关键词
Infrared thermography; Shock response spectrum; Defect identification; Composite materials; Thermal 1-layer model; THERMAL CONTRAST;
D O I
10.1016/j.ndteint.2024.103154
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We propose an alternative method for processing infrared thermography (IRT) data based on a thermal 1-layer model. The method is based on the analogy of the Shock Response Spectrum (SRS) analysis for mechanical systems (ISO 18431). A thermal Q-factor, similar to the resonance sharpness (Q-factor) of a mechanical oscillator, is introduced as a parameter for selecting a specific thermal 1-layer model. Two main aspects of this method and corresponding properties have been considered: the strictly model-based treatment of this methodology and an empirical introduction of additional bandpass filters. The method is validated with two practical examples: for a homogeneous polymer sheet with blind holes and an inhomogeneous plate made of carbon fiber reinforced polymer (CFRP) with artificial defects, the capability of defect detection is compared with established methods. The comparison of the results with the commonly used data processing methods of IRT as Pulsed Phase Thermography (PPT) and Modified Differential Absolute Contrast (MDAC) shows equivalent or sometimes improved performance.
引用
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页数:15
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