Investigation of an irradiated CCD device: Building and testing a Charge Transfer Inefficiency correction pipeline using the Pyxel framework

被引:0
|
作者
Kelman, Bradley [1 ]
Prod'homme, Thibaut [2 ]
Skottfelt, Jesper [1 ]
Hall, David [1 ]
Lemmel, Frederic [2 ]
Seibert, Constanze [2 ]
Verhoeve, Peter [2 ]
Hubbard, Michael [1 ]
机构
[1] Open Univ, Ctr Elect Imaging, Walton Hall, Milton Keynes MK7 6AA, Bucks, England
[2] European Space Agcy, ESTEC, Keplerlaan 1, NL-2201 AZ Noordwijk, Netherlands
关键词
Charge Transfer Inefficiency; CTI correction; Detectors; CCD; Radiation damage; Space radiation; Pyxel; Software; MODEL;
D O I
10.1016/j.nima.2024.169678
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Pyxel is a powerful end-to-end detector simulations framework with the aim of being reusable, reliable and help facilitate knowledge transfer between a wide range of related fields. To show how beneficial Pyxel can be, we present an investigation into the effect of Charge Transfer Inefficiency (CTI) on an irradiated CCD273 device produced by Teledyne-e2v, the type of detector used for the Euclid VIS instrument. This requires production of two pipelines. Firstly, a calibration pipeline to search the parameter space and obtain best fitting trap parameters based upon the CTI within the detector. Secondly, a correction pipeline which aims to correct the CTI-induced data using these trap parameters to obtain a nominal efficiency of 99.5%. The following presents work conducted in building, testing and validating the correction pipeline using Pyxel and the CTI model ArCTIC. This involves data from the unirradiated portion of a CCD-273 device using the scene projection system at the labs at the European Space Agency (ESA). The images are computationally altered by varying parameters such as background levels and readout noise, and by synthetically producing CTI trails from known trap parameters. The resulting images are corrected and analysed to understand how noise affects the correction efficiency at varying image background levels.
引用
收藏
页数:4
相关论文
共 8 条
  • [1] Calibrating and correcting Charge Transfer Inefficiency in CCDs using Pyxel
    Kelman, Bradley
    Prod'homme, Thibaut
    Skottfelt, Jesper
    Lemmel, Frederic
    Arko, Matej
    Liebing, Patricia
    Verhoeve, Peter
    Dryer, Ben
    Hall, David
    Hubbard, Michael
    X-RAY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY X, 2022, 12191
  • [2] Charge transfer inefficiency in the pre- and post-irradiated Swept Charge Device CCD236
    Smith, P. H.
    Gow, J. P. D.
    Pool, P.
    Holland, A. D.
    JOURNAL OF INSTRUMENTATION, 2015, 10
  • [3] A charge transfer inefficiency correction model for the Chandra Advanced CCD Imaging Spectrometer
    Grant, CE
    Bautz, MW
    Kissel, SM
    LaMarr, B
    HIGH-ENERGY DETECTORS IN ASTRONOMY, 2004, 5501 : 177 - 188
  • [4] A comparative study of charge transfer inefficiency value and trap parameter determination techniques making use of an irradiated ESA-Euclid prototype CCD
    Prod'homme, T.
    Verhoeve, P.
    Kohley, R.
    Short, A.
    Boudin, N.
    HIGH ENERGY, OPTICAL, AND INFRARED DETECTORS FOR ASTRONOMY VI, 2014, 9154
  • [5] QUANTITATIVE INVESTIGATION OF CHARGE-TRAPPING EFFECTS ON RAMAN-SPECTRA ACQUIRED USING CHARGE-COUPLED-DEVICE (CCD) DETECTORS
    LACY, WB
    ROWLEN, KL
    HARRIS, JM
    APPLIED SPECTROSCOPY, 1991, 45 (10) : 1598 - 1603
  • [6] Correction to: Sterility testing using a closed system transfer device in oncology medication compounding: a novel method for testing partially used vials
    Allan Mills
    Mary Yousef
    Drugs & Therapy Perspectives, 2021, 37 : 283 - 283
  • [7] Modulation transfer function testing of a time-delay-integrate charge-coupled-device imager using a flashlamp light source
    Canova, BP
    Day, RJ
    Lumia, JJ
    EARTH OBSERVING SYSTEMS IV, 1999, 3750 : 368 - 375
  • [8] Real-time gain correction method using a reference light for an area-parallel-type frame-transfer charge-coupled device with multi-output taps
    Mitani, Kohji
    Sugawara, Masayuki
    Okano, Fumio
    JOURNAL OF ELECTRONIC IMAGING, 2006, 15 (01)