Potential of luminescence imaging for screening sensitive and well-bleached samples for rock surface luminescence dating

被引:0
|
作者
Andricevic, P. [1 ]
Kook, M. [1 ]
Jain, M. [1 ]
机构
[1] Tech Univ Denmark, Dept Phys, DTU Riso Campus, DK-4000 Roskilde, Denmark
关键词
Rock surface dating; Luminescence sensitivity; Spatial resolution; Ris & oslash; imager; EXPOSURE; ELECTRONS; LIGHT;
D O I
10.1016/j.radmeas.2024.107193
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
Rock surface luminescence dating is being increasingly applied to constrain the chronologies of geological and archaeological deposits. Here we investigate the potential of the newly developed Ris & oslash; Imager, a mobile system for measurements in the field, for screening samples with desirable luminescence characteristics. We show by analysing 8 different rock samples, that the Imagers sensitivity is about 50 times lower that than the more commonly used Ris & oslash; TL-OSL Reader. However, the measurement sensitivity can be improved using longer acquisition times for non-destructive infrared photoluminescence. The imager provides a far superior resolution and precision in the luminescence-depth profiles compared to the Reader, with measurement times as small as few minutes. However, based on the examination of luminescence values at zero depth, we speculate that crosstalk from the poorly-bleached, regions below the focal plane of the Imager may be a source of contamination in the luminescence depth profiles, an aspect which requires future investigations.
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页数:6
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