Transient Noise and Gain Characterization for Pulse-Operated LNAs

被引：0
|
作者：
Zeng, Yin [1 ]
Stenarson, Jorgen [2 ]
Sobis, Peter [1 ,2 ]
Grahn, Jan [1 ]
机构：
[1] Chalmers Univ Technol, Dept Microtechnol & Nanosci MC2, S-41296 Gothenburg, Sweden
[2] Low Noise Factory AB, S-41263 Gothenburg, Sweden
来源：
IEEE MICROWAVE AND WIRELESS TECHNOLOGY LETTERS | 2024年 / 34卷 / 07期
关键词：
Low-noise amplifier (LNA); noise figure; noise measurement; transients; RECOVERY-TIME;
D O I：
10.1109/LMWT.2024.3398248
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We propose a novel method for direct characterization of transient noise and gain for a pulsed low-noise amplifier (LNA) with nanosecond resolution over a wide bandwidth. The method used a standard noise source and an oscilloscope to measure the time-domain output waveform of the LNA. Transient noise and gain of a gate-pulse-operated C-band LNA at two biases were measured with 50-ns resolution. The method showed good agreement with static measurements. The transient gain was compared with transient S-parameter and drain current measurements, which confirmed the proposed method.
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页码：911 / 914
页数：4
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