Grating-free autofocus for single-pixel microscopic imaging

被引:0
|
作者
GUAN WANG [1 ]
HUAXIA DENG [1 ]
YU CAI [1 ]
MENGCHAO MA [2 ]
XIANG ZHONG [2 ]
XINGLONG GONG [1 ]
机构
[1] CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China
[2] School of Instrument Science and Opto-electronics Engineering, Hefei University of
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D O I
暂无
中图分类号
O439 [应用光学]; TP391.41 [];
学科分类号
080203 ;
摘要
As a computational technology, single-pixel microscopic imaging(SPMI) transfers the target's spatial information into a temporal dimension. The traditional focusing method of imaging before evaluation is not applicable to the SPMI system. We propose a grating-free autofocus strategy derived from the physical mechanism of optical defocus. Maximizing the amplitude information of just one high-frequency point in the spectrum is all that is needed to achieve fast autofocus with the SPMI system. Accordingly, only four patterns need to be cyclically projected, enabling efficient localization of the focal plane based on the measurement data. We demonstrate SPMI autofocus experiments at micrometer and even nanometer depths of field. The proposed method can be extended to achieve SMPI autofocus with invisible optical pattern illumination.
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页码:1313 / 1321
页数:9
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