Extraction of features of the urban high-rise building from high resolution InSAR data

被引：0
|
作者：
Guo R. [1 ]
Zang B. [2 ]
Peng S. [3 ]
Xing M. [2 ]
机构：
[1] School of Automation, Northwestern Polytechnical Univ., Xi'an
[2] School of Electronic Engineering, Xidian Univ., Xi'an
[3] Troops 95899, Beijing
来源：
Xi'an Dianzi Keji Daxue Xuebao/Journal of Xidian University | 2019年 / 46卷 / 04期
关键词：
High-rise building; feature extraction; Interferometric synthetic aperture radar; Pixels in the same height with the similar orientation; Very high resolution;
D O I：
10.19665/j.issn1001-2400.2019.04.019
中图分类号：
学科分类号：
摘要：
Under decimeter resolution, the projection of an individual high-rise building shows its distinctive features in interferometric synthetic aperture radar (InSAR) images, which can help extract more accurate detail information and supply prior information for advanced interferometric techniques such as Tomography SAR (TomoSAR). In this paper, a top-to-down coarse-to fine approach is proposed to extract high-rise building features, which works at four different levels, namely, image-, region of interest (ROI)-, building- and pixel-wise processing, and which considers the analysis of high-rise building characteristics in very high resolution InSAR data pairs. Finally, the features of the high-rise building including the building orientation and pixels at the same height with the similar orientation are defined and estimated. The proposed approach is validated by using the single-pass interferogram from the TanDEM-X system over high-rise urban areas. © 2019, The Editorial Board of Journal of Xidian University. All right reserved.
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页码：137 / 143
页数：6
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