Determination of the spacing between hydrogen-intercalated quasifreestanding monolayer graphene and 6H -SiC(0001) using total-reflection high-energy positron diffraction

被引：0

作者：

Dodenhoft M. ^{[1
]}

Mochizuki I. ^{[2
]}

Wada K. ^{[2
]}

Hyodo T. ^{[2
]}

Richter P. ^{[3
,4
]}

Schadlich P. ^{[3
,4
]}

Seyller T. ^{[3
,4
]}

Hugenschmidt C. ^{[1
]}

机构：

[1] Forschungs-Neutronenquelle Heinz Maier-Leibnitz FRM II, Technische Universitat Munchen, Lichtenbergstraße 1, Garching

[2] Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK), Ibaraki

[3] Institute for Physics, Technische Universitat Chemnitz, Reichenhainer Straße 70, Chemnitz

[4] Center for Materials, Architectures and Integration of Nanomembranes (MAIN), Rosenbergstraße 6, Chemnitz

来源：

Physical Review B | 2023年 / 108卷 / 15期

关键词：

Compendex;

D O I：

10.1103/PhysRevB.108.155438

中图分类号：

学科分类号：

摘要：

We have investigated the structure of hydrogen-intercalated quasifreestanding monolayer graphene (QFMLG) grown on 6H-SiC(0001) by employing total-reflection high-energy positron diffraction. At least nine diffraction spots of the zeroth-order Laue zone were resolved along (112¯0) and three along (11¯00), which are assigned to graphene, SiC, and higher-order spots from multiple diffraction on both lattices. We further performed a rocking curve analysis based on the full dynamical diffraction theory to precisely determine the spacing between QFMLG and the SiC substrate. Our study yields a spacing of dQFMLG=4.18(6)Å that is in excellent agreement with the results from density-functional theory calculations published previously. © 2023 American Physical Society.

引用

共 10 条

[1] Spacing between graphene and metal substrates studied with total-reflection high-energy positron diffraction
Fukaya, Yuki
Entani, Shiro
Sakai, Seiji
Mochizuki, Izumi
Wada, Ken
Hyodo, Toshio
Shamoto, Shin-ichi
CARBON, 2016, 103 : 1 - 4
[2] Structure of superconducting Ca-intercalated bilayer Graphene/SiC studied using total-reflection high-energy positron diffraction
Endo, Y.
Fukaya, Y.
Mochizuki, I
Takayama, A.
Hyodo, T.
Hasegawa, S.
CARBON, 2020, 157 : 857 - 862
[3] Effect of hydrogen etching on 6H SiC surface morphology studied by reflection high-energy positron diffraction and atomic force microscopy
Kawasuso, A
Kojima, K
Yoshikawa, M
Itoh, H
Narumi, K
APPLIED PHYSICS LETTERS, 2000, 76 (09) : 1119 - 1121
[4] Data-driven sensitivity analysis in surface structure determination using total-reflection high-energy positron diffraction (TRHEPD)
Hoshi, Takeo
Sakata, Daishiro
Oie, Shotaro
Mochizuki, Izumi
Tanaka, Satoru
Hyodo, Toshio
Hukushima, Koji
COMPUTER PHYSICS COMMUNICATIONS, 2022, 271
[5] Atomic hydrogen beam etching of carbon superstructures on 6H-SiC(0001) studied by reflection high-energy electron diffraction
Xie, XN
Lim, R
Li, J
Li, SFY
Loh, KP
DIAMOND AND RELATED MATERIALS, 2001, 10 (3-7) : 1218 - 1223
[6] Total-reflection high-energy positron diffraction (TRHEPD) for structure determination of the topmost and immediate sub-surface atomic layers
Fukaya, Yuki
Kawasuso, Atsuo
Ichimiya, Ayahiko
Hyodo, Toshio
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 2019, 52 (01)
[7] Structure determination of the rutile-TiO2(110)-(1 x 2) surface using total-reflection high-energy positron diffraction (TRHEPD)
Mochizuki, I.
Ariga, H.
Fukaya, Y.
Wada, K.
Maekawa, M.
Kawasuso, A.
Shidara, T.
Asakura, K.
Hyodo, T.
PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2016, 18 (10) : 7085 - 7092
[8] Reconstructions of 6H-SiC(0001) surfaces studied by scanning tunneling microscopy and reflection high-energy electron diffraction
Hisada, Y
Hayashi, K
Kato, K
Aoyama, T
Mukainakano, S
Ichimiya, A
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (4A): : 2211 - 2216
[9] Reconstructions of 6H-SiC(0001) surfaces studied by scanning tunneling microscopy and reflection high-energy electron diffraction
Hisada, Y.
Hayashi, K.
Kato, K.
Aoyama, T.
Mukainakano, S.
Ichimiya, A.
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (4 A): : 2211 - 2216
[10] Reflection high-energy electron diffraction pattern of GaN grown on 6H-SiC by metalorganic molecular beam epitaxy using AlGaN template
Honda, T
Kawanishi, H
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2003, 21 (04): : 1822 - 1824

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