The future of optical measurement technology: A review of new developments in optical metrology and industry trends in the digitalization and integration of these solutions for in situ and inline measurements

被引：0

|

作者：

Castelo-Porta, Antonio ^{[1
]}

机构：

[1] EPIC – European Photonics Consortium Industry, 17 Rue Hamelin, Paris, France

来源：

PhotonicsViews | 2023年 / 20卷 / 02期

关键词：

Compendex;

D O I：

10.1002/phvs.202300015

中图分类号：

学科分类号：

摘要：

Optical data processing

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页码：72 / 75

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[J]. Journal of Research of the National Institute of Standards and Technology, 1999, 104 (06):