Polarization-dependent losses in porous silicon ridge waveguides

被引：2
|
作者：
Cassio, F. [1 ]
Poffo, L. [1 ]
Lorrain, N. [1 ]
Pirasteh, P. [1 ]
Lemaitre, J. [1 ]
Guendouz, M. [1 ]
机构：
[1] Univ Rennes 1, UMR FOTON, CNRS, Enssat, F-22305 Lannion, France
来源：
RESULTS IN OPTICS | 2022年 / 9卷
关键词：
Porous silicon ridge waveguide; Integrated optics; Optical sensor; Polarization light; PHOTOLUMINESCENCE;
D O I：
10.1016/j.rio.2022.100269
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Porous silicon is a material used in integrated optics with few studies on its structuration impact on the polarization in the near infra-red spectral range. In this letter, we report experimental results from optical characterizations around the wavelength of 1550 nm and for different input polarization in porous silicon ridge waveguides. We highlight filtering of light polarization that attenuates transverse electric mode in passive porous silicon ridge waveguides.
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页数：4
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