共 28 条
- [1] (2019)
- [2] SHIGETA Y, SATO N, ARAI K, Et al., High spatial resolution on-chip active magnetic field probe for IC chip-level near field measurements, Proceedings of the International Symposium on Electro-magnetic Compatibility, pp. 569-572, (2014)
- [3] MAI-KHANH N N, IIZUKA T, YAMADA M, Et al., An integrated high-precision probe system in 0. 18μm CMOS for near-field magnetic measurements on cryptographic LSIs, IEEE Sensors, 13, 7, pp. 2675-2682, (2013)
- [4] DHIA S B, RAMDANI M, SICARD E., Electronmagnetic compatibility of integrated circuits technique for low emission and susceptibility, (2006)
- [5] MUROGA S, ARAI K, DHUANGANA S, Et al., 3-D magnetic-near-field scanner for IC chip-level noise coupling measurements, IEEE Transactions on Magnetics, 49, 7, pp. 3886-3889, (2013)
- [6] PEETERS E, STANDAERT F X, QUISQUATER J J., Power and electromagnetic analysis: Improved model, consequences and comparisons, The VLSI Journal Integration, 40, pp. 52-60, (2007)
- [7] LI G, POMMERENKE D, MIN J., A low frequency electric field probe for near-field measurement in EMC applications, Proceedings of the International Symposium on Electro-magnetic Compatibility & Signal/Power Integrity(EMCSI), pp. 498-503, (2017)
- [8] MIN Z, YAN Z, LIU W, Et al., A miniature high sensitivity active electric field probe for near-field measuremen, IEEE Antennas and Wireless Propagation Letters, 18, 12, pp. 2552-2556, (2019)
- [9] CHEN K, ZHAO Q, ZHANG P, Et al., The power of electromagnetic analysis on embedded cryptographic ICs, Proceedings of the International Conf. on Embedded Software and Systems Symposia(ISESS), pp. 197-201, (2008)
- [10] AMAGUCHI M Y, TORIDUKA H, KOBAYASHI S, Et al., Development of an on-chip micro shield-loop probe to evaluate performance of magnetic film to protect a cryptographic LSI from electromagnetic analysis, Proceedings of the IEEE International Symposium on Electromagnetic Compatibility, pp. 103-108, (2010)