Methods of detecting defects using infrared thermography

被引：0
|
作者：
Kolecka, Olga [1 ]
机构：
[1] Politech Czestochowska, Katedra Automatyki Elektrotech & Optoelektron, Al Armii Krajowej 17, PL-42200 Czestochowa, Poland
来源：
PRZEGLAD ELEKTROTECHNICZNY | 2024年 / 100卷 / 04期
关键词：
infrared thermography; active methods; pasive method; non-destructive testing;
D O I：
10.15199/48.2024.04.19
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The paper presents the infrared thermography methods used for detecting defects. Based on the author's scientific and research works and literature sources, non-destructive tests, mainly of composite materials, were presented. Their methodology, possibilities of use and imperfections of the structure of the tested object and the measuring equipment used were presented.
引用
收藏
页码：101 / 104
页数：4
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