The influences of Ag nanoparticles on voids growth and solderability about Sn3.0Ag0.5Cu/Cu solder joint

被引:1
|
作者
Zhao, Lingyan [1 ,2 ]
Bai, Hailong [1 ,2 ]
Gu, Xin [3 ]
Liang, Huaxin [2 ]
Yang, Hongwei [1 ]
Yan, Jikang [4 ]
机构
[1] Kunming Univ Sci & Technol, Fac Met & Energy Engn, Kunming 650093, Peoples R China
[2] Yunnan Tin Grp Holding Co Ltd, R&D Ctr, Kunming 650106, Peoples R China
[3] Kunming Univ Sci & Technol, Fac Mat Sci & Engn Kunming, Kunming 650093, Peoples R China
[4] Southwest Petr Univ, Sch Engn, Nanchong 637001, Peoples R China
关键词
Sn3.0Ag0.5Cu; Ag nanoparticles; solderability; voids growth; CREEP RESISTANCE; MICROSTRUCTURE; EVOLUTION; ALLOY;
D O I
10.1088/2053-1591/ad4197
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Although Sn3.0Ag0.5Cu solder (SAC305) has higher reliability, there are a large number of harmful voids in solder joints. Larger voids can reduce thermal conductivity of solder joints. However, as a microstructure growth inhibitor, the influences of Ag nanoparticles on voids growth are not clear at present. Herein, we prove that Ag nanoparticles can increase SAC305 solderability, but promote voids growth. Ag nanoparticles and SAC305 solder paste were mixed by mechanical stirring for 0.5 h. Next, SAC305-xAgP (x = 0, 0.1, 0.2, 0.3, 0.4 and 0.5 wt%) was obtained. The results indicated that solder solderability was improved increasingly with Ag nanoparticles addition. The lower the amount of nanoparticles added, the greater the final loss. After being aged at 100 degrees C for 150 h, the voids stopped growing. Due to the violent reaction between Ag nanoparticles and flux, the final voids growth rate became faster, and the average voids size changed from 14.34% to 24.91%.
引用
收藏
页数:7
相关论文
共 50 条
  • [1] Electromigration in Sn3.0Ag0.5Cu flip chip solder joint
    Lu Yu-Dong
    He Xiao-Qi
    En Yun-Fei
    Wang Xin
    Zhuang Zhi-Qiang
    ACTA PHYSICA SINICA, 2009, 58 (03) : 1942 - 1947
  • [2] Size effect of Sn3.0Ag0.5Cu solder joint on intermetallic layer growth
    Wang, Shaobin
    Yao, Yao
    2017 18TH INTERNATIONAL CONFERENCE ON ELECTRONIC PACKAGING TECHNOLOGY (ICEPT), 2017, : 1547 - 1551
  • [3] The influences of reactive nanoparticles alloying on grain boundary and melting properties about Sn3.0Ag0.5Cu solder
    Gu, Xin
    Bai, Hailong
    Chen, Dongdong
    Zhao, Lingyan
    Yi, Jianhong
    Liu, Xiang
    Yan, Jikang
    INTERMETALLICS, 2021, 138
  • [4] Microstructure growth and tensile strength of Cu/Sn3.0Ag0.5Cu/Cu solder joints
    Yang, Linmei
    Quan, Shanyu
    Shi, Guimei
    MATERIALS RESEARCH EXPRESS, 2019, 6 (01)
  • [5] Effects of Mo nanoparticles on growth of compounds layer and strength of Sn3.0Ag0.5Cu/Cu solder joint during thermal cycling
    Ma, Shiran
    Yang, Linmei
    Yang, Jiyou
    Liang, Yawei
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2024, 35 (21)
  • [6] Investigation of Stress Evolution at the Interface of Cu/Sn3.0Ag0.5Cu/Cu Solder Joint during Electromigration
    He Hongwen
    Zhao Haiyan
    Ma Limin
    Xu Guangchen
    Guo Fu
    RARE METAL MATERIALS AND ENGINEERING, 2012, 41 : 401 - 404
  • [7] Suppression of void nucleation in Sn3.0Ag0.5Cu/CU solder joint by rapid thermal processing
    Li, Hailong
    An, Rong
    Wang, Chunqing
    Li, Bin
    MATERIALS LETTERS, 2015, 158 : 252 - 254
  • [8] Influence Mechanism of Pad Type on the Shear Performance of Sn3.0Ag0.5Cu/Cu Solder Joint
    Wang, Xin
    Li, Xunping
    Pan, Kailin
    Zhou, Bin
    Jiang, Tingbiao
    PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II, 2014, : 694 - 697
  • [9] Microstructure and properties of Sn1.0Ag0.5Cu and Sn3.0Ag0.5Cu lead-free solder
    School of Mechanical and Electrical Engineering, Jiangsu Normal University, Xuzhou
    221116, China
    不详
    450001, China
    Xiyou Jinshu, 7 (589-593):
  • [10] Effect of Reflow Profile Parameters on Shear Performance of Sn3.0Ag0.5Cu/Cu Solder Joint
    Wang, Xin
    Li, Xunping
    Pan, Kailin
    Zhou, Bin
    Jiang, Tingbiao
    PROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II, 2014, : 691 - 693