On the optimality of kernel-embedding based goodness-of-fit tests

被引：0

作者：

Balasubramanian, Krishnakumar ^{[1
]}

Li, Tong ^{[2
]}

Yuan, Ming ^{[2
]}

机构：

[1] Department of Statistics, University of California, Davis, Davis,CA,95616, United States

[2] Department of Statistics, Columbia University, New York,NY,10027, United States

来源：

Journal of Machine Learning Research | 2021年 / 22卷

关键词：

Compendex;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：1 / 45

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