Ag3Sn粗化模型及其对Sn-Ag-Cu焊料蠕变的影响

被引:6
|
作者
王小京 [1 ]
祝清省 [1 ]
王中光 [1 ]
尚建库 [1 ,2 ]
机构
[1] 中国科学院金属研究所沈阳材料科学国家(联合)实验室
[2] Department of Materials Science and Engineering,University of Illinois at
关键词
无铅焊料; 粒子粗化; 电流;
D O I
暂无
中图分类号
TG40 [焊接一般性问题];
学科分类号
摘要
本文用位错蠕变模型,描述了在电流作用下,无铅焊料Sn-Ag-Cu(SAC)中第二相粒子-Ag3Sn的粗化过程及其对蠕变速率的影响.模型中焊料组织被简化为:β-Sn母相基体和在基体上弥散分布的Ag3Sn第二相粒子.基于Lifshitz-Wagner理论,得到了描述第二相粒子尺寸演化的关系式,式中包括稳态应变和电流作用引起的两部分组化.
引用
收藏
页码:912 / 918
页数:7
相关论文
共 11 条
  • [1] Quantitative metallography of β-Sn dendrites in Sn-3.8Ag-0.7Cu ball grid array solder balls via electron backscatter diffraction and polarized light microscopy
    LaLonde, A
    Emelander, D
    Jeannette, J
    Larson, C
    Rietz, W
    Swenson, D
    Henderson, DW
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1545 - 1549
  • [2] Mechanical properties of near-eutectic Sn-Ag-Cu alloy over a wide range of temperatures and strain rates
    Korhonen, TMK
    Turpeinen, P
    Lehman, LP
    Bowman, B
    Thiel, GH
    Parkes, RC
    Korhonen, M
    Henderson, DW
    Puttlitz, KJ
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1581 - 1588
  • [3] Grain-boundary character and grain growth in bulk tin and bulk lead-free solder alloys
    Telang, AU
    Bieler, TR
    Lucas, JP
    Subramanian, KN
    Lehman, LR
    Xing, Y
    Cotts, EJ
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1412 - 1423
  • [4] Growth of Sn and intermetallic compounds in Sn-Ag-Cu solder
    Lehman, LP
    Athavale, SN
    Fullem, TZ
    Giamis, AC
    Kinyanjui, RK
    Lowenstein, M
    Mather, K
    Patel, R
    Rae, D
    Wang, J
    Xing, Y
    Zavalij, L
    Borgesen, P
    Cotts, EJ
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2004, 33 (12) : 1429 - 1439
  • [5] Microstructure coarsening during static annealing of 60Sn40Pb solder joints: III intermetallic compound growth kientics.[J].Kang Jung;Hans Conrad.Journal of Electronic Materials.2001, 10
  • [6] Microstructure coarsening during static annealing of 60Sn40Pb solder joints: II eutectic coarsening kinetics.[J].Kang Jung;Hans Conrad.Journal of Electronic Materials.2001, 10
  • [7] Microstructure coarsening during static annealing of 60Sn40Pb solder joints: I stereology.[J].Kang Jung;Hans Conrad.Journal of Electronic Materials.2001, 10
  • [8] Creep phenomena in lead-free solders
    Igoshev, VI
    Kleiman, JI
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2000, 29 (02) : 244 - 250
  • [9] Coarsening of the Sn-Pb solder microstructure in constitutive model-based predictions of solder joint thermal mechanical fatigue
    Vianco, PT
    Burchett, SN
    Nielsen, MK
    Rejent, JA
    Frear, DR
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (11) : 1290 - 1298
  • [10] Influence of microstructure size on the plastic deformation kinetics, fatigue crack growth rate, and low-cycle fatigue of solder joints
    Conrad, H
    Guo, Z
    Fahmy, Y
    Yang, D
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (09) : 1062 - 1070