TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY

被引：3
|
作者：
TANIGUCHI, K
NINOMIYA, T
机构：
来源：
TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN | 1990年 / 76卷 / 08期
关键词：
D O I：
10.2355/tetsutohagane1955.76.8_1228
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：1228 / 1236
页数：9
相关论文
共 50 条
  • [1] TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR SURFACE-ANALYSIS
    KNOTH, J
    SCHWENKE, H
    WEISBROD, U
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) : 477 - 481
  • [2] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY - PROCEEDINGS OF THE 4TH WORKSHOP ON TOTAL-REFLECTION X-RAY-FLUORESCENCE (TXRF) - PREFACE
    PRANGE, A
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1993, 48 (02) : 107 - 109
  • [3] FUNDAMENTALS OF TOTAL REFLECTION X-RAY-FLUORESCENCE
    KREGSAMER, P
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1991, 46 (10) : 1333 - 1340
  • [4] DETERMINATION OF METALS IN OIL USING TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    BILBREY, DB
    LELAND, DJ
    LEYDEN, DE
    WOBRAUSCHEK, P
    AIGINGER, H
    [J]. X-RAY SPECTROMETRY, 1987, 16 (04) : 161 - 165
  • [5] APPLICATION OF TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY IN MATERIAL ANALYSIS
    HOFFMANN, P
    HEIN, M
    SCHEUER, V
    LIESER, KH
    [J]. MIKROCHIMICA ACTA, 1990, 2 (1-6) : 305 - 313
  • [6] TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR QUANTITATIVE SURFACE AND LAYER ANALYSIS
    WEISBROD, U
    GUTSCHKE, R
    KNOTH, J
    SCHWENKE, H
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1991, 53 (05): : 449 - 456
  • [7] MICROANALYSIS OF SOLID SAMPLES BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    VONBOHLEN, A
    ELLER, R
    KLOCKENKAMPER, R
    TOLG, G
    [J]. ANALYTICAL CHEMISTRY, 1987, 59 (21) : 2551 - 2555
  • [8] SUITABILITY OF TOTAL REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY FOR ELEMENTAL SPECIATION STUDIES
    MUKHTAR, S
    HASWELL, SJ
    [J]. JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 1991, 6 (04) : 339 - 341
  • [9] TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROSCOPY
    KLOCKENKAMPER, R
    KNOTH, J
    PRANGE, A
    SCHWENKE, H
    [J]. ANALYTICAL CHEMISTRY, 1992, 64 (23) : A1115 - +
  • [10] ANALYSIS OF THIN-LAYERS BY TOTAL-REFLECTION X-RAY-FLUORESCENCE SPECTROMETRY
    HOFFMANN, P
    LIESER, KH
    HEIN, M
    FLAKOWSKI, M
    [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1989, 44 (05) : 471 - 476
12345