POWER SPECTRAL CHARACTERIZATION OF TNT FRACTURE SURFACES USING ATOMIC-FORCE MICROSCOPY

被引：0
|
作者：
LANZEROTTI, YD
机构：
[1] AT&T BELL LABS,MURRAY HILL,NJ 07974
[2] USA,ARDEC,RICATINNY ARSENAL,NJ 07806
[3] NEW YORK CITY TECH COLL,BROOKLYN,NY 11201
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1995年 / 209卷
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D O I：
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：192 / PHYS
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