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EVIDENCE OF GAMMA-FREE OR BOUND-TO-DEEP ACCEPTOR CHARACTER OF THE Y-1.2 EV DEEP PHOTOLUMINESCENCE LINE IN N-TYPE GE-DOPED GAAS DERIVED FROM HIGH HYDROSTATIC-PRESSURE EXPERIMENTS IN DIAMOND-ANVIL CELL
被引:1
|作者:
DMOCHOWSKI, JE
STRADLING, RA
PRINS, AD
DUNSTAN, DJ
ADAMS, AR
KUKIMOTO, H
机构:
[1] UNIV LONDON IMPERIAL COLL SCI TECHNOL & MED,BLACKETT LAB,LONDON SW7 2BZ,ENGLAND
[2] UNIV SURREY,DEPT PHYS,GUILDFORD GU2 5XH,SURREY,ENGLAND
[3] TOKYO INST TECHNOL,IMAGING SCI & ENGN LAB,MIDORI KU,YOKOHAMA,KANAGAWA 227,JAPAN
关键词:
D O I:
10.12693/APhysPolA.84.649
中图分类号:
O4 [物理学];
学科分类号:
0702 ;
摘要:
The dependence of the energy position of the deep defect-related photoluminescence line Y-1.2 eV in Ge-doped GaAs on high hydrostatic pressure is investigated using a Dunstan-type diamond anvil cell. The observation that the energy position of the line follows that of the GAMMA-conduction band minimum in the 1 bar-30 kbar pressure range demonstrates that the line has GAMMA-(free or shallow bound)-to-deep acceptor character. This fact confirms the deep-acceptor character of the deep defect, most likely a donor impurity-Ga vacancy complex, which contributes to the Y-1.2 eV photoluminescence line.
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页码:649 / 652
页数:4
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