S-PARAMETERS MEASUREMENT OF CHIP GAAS-FETS UP TO 22 GHZ USING THE TRL CALIBRATION TECHNIQUE

被引：1
|
作者：
PRADELL, L
ARTAL, E
SABATER, C
机构：
来源：
19TH EUROPEAN MICROWAVE CONFERENCE : MICROWAVE 89 | 1989年
关键词：
D O I：
10.1109/EUMA.1989.334030
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：576 / 581
页数：6
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