INDUCED CRITICAL-CURRENT DENSITY LIMIT OF AG SHEATHED BI-2223 TAPE CONDUCTOR

被引:0
|
作者
OGIWARA, H [1 ]
SATOU, M [1 ]
YAMADA, Y [1 ]
KITAMURA, T [1 ]
HASEGAWA, T [1 ]
机构
[1] SHOWA ELECT WIRE & CABLE CO LTD,KAWASAKI KU,KAWASAKI 210,JAPAN
关键词
Bismuth compounds - Crystal structure - Crystals - Electric coils - Electric conductivity - Induced currents - Interfaces (materials) - Magnetic fields - Silver - Superconducting materials - Tapes;
D O I
10.1109/20.305760
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have already reported the best critical current density of 66,000 A/cm2 with an Ag sheathed Bi-2223 tape conductor. The Brick-wall model is for explaining the current transport mechanism of this conductor. The model has its roots in the fact that the Bi-2223 tape com is a complicated stack of crystals which have a mica-flake structure. The orientation of the crystals seriously affects the current transport capability. Moreover, the contacts between the stacking crystals are very important. The transport current flows dividing into many branch paths. Under high magnetic field, the different paths experienced different electromagnetic forces. Differences between the electromagnetic forces on the different crystals can affect the contacts so as to increase resistivity and decrease overall critical current density of the tape. This effect can foretell the limit of the critical current density obtainable with these kind of conductors.
引用
收藏
页码:2399 / 2401
页数:3
相关论文
共 50 条
  • [1] Critical current density and best transport current of an Ag-sheathed Bi-2223 tape conductor
    Ogiwara, H
    Yamada, Y
    Satou, M
    Kitamura, T
    Hasegawa, T
    [J]. CERAMICS INTERNATIONAL, 1997, 23 (01) : 1 - 5
  • [2] CRITICAL-CURRENT DENSITY ENHANCEMENT IN AG-SHEATHED BI-2223 SUPERCONDUCTING TAPES
    LI, Q
    BRODERSEN, K
    HJULER, HA
    FRELTOFT, T
    [J]. PHYSICA C, 1993, 217 (3-4): : 360 - 366
  • [3] Characterization of critical current density in silver-sheathed Bi-2223 tape
    Matsushita, T
    Himeda, Y
    Kiuchi, M
    Fujikami, J
    Hayashi, K
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 2005, 15 (02) : 2518 - 2521
  • [4] CRITICAL-CURRENT DENSITIES AND VOLTAGE-CURRENT CHARACTERISTICS IN AG-SHEATHED BI-2223 TAPES
    MAWATARI, Y
    YAMASAKI, H
    KOSAKA, S
    [J]. IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1995, 5 (02) : 1305 - 1308
  • [6] Strain effects on the critical current of Bi-2223/Ag tape
    Wu, Y. L.
    Wang, Z. D.
    Xiong, Y. F.
    [J]. ICEC 20: PROCEEDINGS OF THE TWENTIETH INTERNATIONAL CRYOGENIC ENGINEERING CONFERENCE, 2005, : 491 - 494
  • [7] Investigation on the anisotropy of the current density characteristics and flux pinning in Ag-sheathed Bi-2223 tape
    Tang, YL
    Chen, WM
    Lu, DW
    Shan, L
    Xu, LK
    Xu, XN
    Jin, X
    [J]. PHYSICA C, 2001, 351 (02): : 139 - 144
  • [8] ELIMINATION OF SWELLING OF THE AG-SHEATHED BI-2223 TAPE
    LU, SW
    TSAI, MJ
    [J]. CHINESE JOURNAL OF PHYSICS, 1993, 31 (06) : 1209 - 1214
  • [9] BI-2223/AG-SHEATHED TAPE PROCESSING STUDIES
    WILLIS, JO
    RAY, RD
    PHILLIPS, DS
    SALAZAR, KV
    BINGERT, JF
    HOLESINGER, TG
    BREMSER, JK
    PETERSON, DE
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1995, 24 (12) : 1789 - 1792
  • [10] Critical current density and current-voltage characteristics in Ag-sheathed Bi-2223 tapes
    Mawatari, Y.
    Yamasaki, H.
    Kosaka, S.
    Umeda, M.
    [J]. Denshi Gijutsu Sogo Kenkyusho Iho/Bulletin of the Electrotechnical Laboratory, 1995, 59 (11-12): : 75 - 84