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- [1] A NOVEL TECHNIQUE FOR MEASURING THE FREQUENCY DEVIATION OF SEMICONDUCTOR-LASERS UNDER DIRECT MODULATION JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (01): : L19 - L21
- [3] DIRECT FREQUENCY-MODULATION AND FM NOISE IN SEMICONDUCTOR-LASERS REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1983, 31 (03): : 349 - 360