LOW-FREQUENCY NOISE IN SUPERCONDUCTING NANOCONSTRICTION DEVICES

被引：0
|
作者：
HATLE, M
KOJIMA, K
HAMASAKI, K
机构：
来源：
IEICE TRANSACTIONS ON ELECTRONICS | 1994年 / E77C卷 / 08期
关键词：
SUPERCONDUCTING WEAK LINK; ANDREEV REFLECTION; SNS SYSTEM; LOW FREQUENCY NOISE; CONDUCTANCE FLUCTUATIONS;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The magnitude of low frequency noise is studied in a Nb-(nanoconstrictions)-NbN system with adjustable current-voltage characteristics. We find that the magnitude of low frequency noise decrease sharply with increasing the subgap conductivity of the device. We suggest a qualitative explanation of this observation in terms of gradual build up of the nanoconstriction region by field assisted growth. The decrease of low frequency noise is related to the ''cleanliness'' of the system as measured by the amount of Andreev reflection-related conductivity. The scaling of the magnitude of low frequency noise with device resistance is also discussed.
引用
收藏
页码：1169 / 1175
页数：7
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