SCALABLE SMALL-SIGNAL MODEL FOR BJT SELF-HEATING

被引：13
|
作者：
FOX, RM
LEE, SG
机构：
[1] VLSI TCAD Group, Department of Electrical Engineering, University of Florida, Gainesville
来源：
IEEE ELECTRON DEVICE LETTERS | 1991年 / 12卷 / 12期
关键词：
D O I：
10.1109/55.116943
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The effects of self-heating on BJT behavior are demonstrated through measurement and simulation. Most affected are the small-signal parameters Y22 and Y12. A frequency-domain solution to the heat-flow equation is presented that applies to any rectangular emitter geometry. This model, although simple enough for CAD, predicts thermal spreading impedance with good accuracy for a wide range of frequencies.
引用
收藏
页码：649 / 651
页数：3
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