ATOMIC FORCE AND SCANNING TUNNELING MICROSCOPIES OF ORGANIC-SURFACES

被引：27
|
作者：
FUCHS, H
机构：
[1] BASF Aktiengesellschaft, Polymer Research Laboratory, W-6700 Ludwigshafen
来源：
JOURNAL OF MOLECULAR STRUCTURE | 1993年 / 292卷
关键词：
D O I：
10.1016/0022-2860(93)80088-D
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Recent progress in scanned probe microscopies (SPM) such as scanning tunneling microscopy (STM) and atomic force microscopy (AFM) on organic surfaces is reviewed. Topics include imaging of individual chemisorbed molecules, supported physisorbed molecular assemblies, biopolymers and (bulk) synthetic polymeric materials investigated under various environmental conditions such as vacuum, fluids and air. The effects of tip/surface interactions that result in local surface modifications and image alterations are discussed. The potential of the AFM to measure the local elastic and tribological properties of organic surfaces is demonstrated.
引用
收藏
页码：29 / 47
页数：19
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