MODIFIED RESIDUAL-GAS ANALYZERS AS SOURCES OF MASS-SELECTED ION-BEAMS

被引：5
|
作者：
GILBERT, JR
LEROI, GE
ALLISON, J
机构：
[1] Chemistry Department, Michigan State University, East Lansing
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1991年 / 107卷 / 02期
关键词：
D O I：
10.1016/0168-1176(91)80062-R
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
Inexpensive sources which can produce high current beams of mass-selected ions, formed using several ionization techniques, have been constructed through the modification of residual gas analyzers (RGAs). Through a combination of computer modeling and ion beam visualization, a series of ion optical modifications has been performed and characterized that allow for production, manipulation, and detection of the mass-selected ion beam produced by the RGA. These sources can be used in a broad range of experiments, in some cases replacing larger mass spectrometers.
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页码：247 / 263
页数：17
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