TRACE ANALYSIS OF OXYGEN IN COPPER AND SILICON BY SPARK SOURCE-MASS SPECTROMETRY

被引：5

作者：

BESKE, HE ^{[1
]}

FRERICHS, G ^{[1
]}

MELCHERS, FG ^{[1
]}

机构：

[1] KERN FORSCH ANLAGE,ZENT INST ANAL CHEM,POSTFACH 365,D-5170 JULICH,WEST GERMANY

来源：

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE | 1973年 / 267卷 / 02期

关键词：

D O I：

10.1007/BF00429959

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：99 / 103

页数：5

共 50 条

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