SCANNING X-RAY-EMISSION MICROSCOPY

被引：0
|
作者：
LEAMY, HJ
FERRIS, SD
机构：
来源：
APPLIED PHYSICS LETTERS | 1972年 / 20卷 / 03期
关键词：
D O I：
10.1063/1.1654070
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
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页码：115 / &
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