X-RAY-FLUORESCENCE DETECTION OF LOW-Z ELEMENTS USING A MICROCHANNEL PLATE DETECTOR

被引：17
|
作者：
ROSENBERG, RA
SIMONS, JK
FRIGO, SP
TAN, K
CHEN, JM
机构：
[1] UNIV WISCONSIN MADISON,CTR SYNCHROTRON RADIAT,STOUGHTON,WI 53589
[2] CANADIAN SYNCHROTRON RADIAT FACIL,STOUGHTON,WI 53589
[3] SYNCHROTRON RADIAT RES CTR,TAIPEI,TAIWAN
[4] UNIV WISCONSIN,DEPT CHEM,MADISON,WI 53706
[5] UNIV WISCONSIN,DEPT PHYS,MADISON,WI 53706
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 1992年 / 63卷 / 04期
关键词：
D O I：
10.1063/1.1143137
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We demonstrate the utility of a simple, inexpensive, microchannel plate (MCP) detector for monitoring the x-ray fluorescence (XRF) yield in the soft x-ray region. The detector consists of a dual MCP array, and appropriately biased grids. We compare the Al 2p XRF yield to the total-electron yield (TEY) (obtained with the same detector) of single-crystal sapphire. These measurements show that the XRF yield has the following advantages over TEY for monitoring absorption spectra in the soft x-ray region: (1) a greater bulk sensitivity, (2) an insensitivity to charging.
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页码：2193 / 2194
页数：2
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