MEASUREMENT OF LANGMUIR-FILM PROPERTIES BY OPTICAL-WAVEGUIDE PROBE

被引：15

作者：

WALPITA, LM ^{[1
]}

PITT, CW ^{[1
]}

机构：

[1] UCL, DEPT ELECTR & ELECT ENGN, LONDON WC1E 7JE, ENGLAND

来源：

关键词：

D O I：

10.1049/el:19770153

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：210 / 212

页数：3

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