CHEMICAL-VAPOR-DEPOSITION AND PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION CARBONIZATION OF SILICON MICROTIPS

被引:8
|
作者
ZHIRNOV, VV
GIVARGIZOV, EI
机构
来源
关键词
D O I
10.1116/1.587402
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Silicon microtips for field emission applications were coated with thin silicon carbide layers by chemical vapor deposition (CVD) and plasma-enhanced CVD (PECVD) at temperatures of 800 to 1200-degrees-C using propane or a methane/propane mixture as carbon sources. Coatings from 4 to 30 nm thick were obtained. Scanning electron microscopy and Auger electron spectroscopy were used to investigate the morphology and composition of the carbonized tips. Both silicon carbide and pure carbon coatings could be formed depending on the process parameters used. Sharp carbonized tips were obtained by PECVD using propane flow concentrations.
引用
下载
收藏
页码:633 / 637
页数:5
相关论文
共 50 条
  • [1] PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION
    MOLLER, W
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1993, 56 (06): : 469 - 469
  • [2] MODELING OF SILICON-NITRIDE DEPOSITION BY RF PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION
    MASI, M
    BESANA, G
    CANZI, L
    CARRA, S
    CHEMICAL ENGINEERING SCIENCE, 1994, 49 (05) : 669 - 679
  • [3] PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF AMORPHOUS SE FILMS
    NAGELS, P
    SLEECKX, E
    CALLAERTS, R
    JOURNAL DE PHYSIQUE IV, 1995, 5 (C5): : 1109 - 1115
  • [4] INHOMOGENEOUS DIELECTRICS GROWN BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION
    LIM, S
    RYU, JH
    WAGER, JF
    CASAS, LM
    THIN SOLID FILMS, 1993, 236 (1-2) : 64 - 66
  • [5] THE PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF CUINSE2
    JONES, PA
    JACKSON, AD
    LICKISS, PD
    PILKINGTON, RD
    TOMLINSON, RD
    THIN SOLID FILMS, 1994, 238 (01) : 4 - 7
  • [6] RUGATE FILTERS GROWN BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION
    LIM, S
    RYU, JH
    WAGER, JF
    PLANT, TK
    THIN SOLID FILMS, 1994, 245 (1-2) : 141 - 145
  • [7] PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION OF SILICON DIOXIDE DEPOSITED AT LOW-TEMPERATURES
    CEILER, MF
    KOHL, PA
    BIDSTRUP, SA
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1995, 142 (06) : 2067 - 2071
  • [8] REACTIVE ION ETCHING OF SILICON OXYNITRIDE FORMED BY PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION
    UENO, K
    KIKKAWA, T
    TOKASHIKI, K
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (04): : 1447 - 1450
  • [9] A NEW MODULAR MULTICHAMBER PLASMA-ENHANCED CHEMICAL-VAPOR-DEPOSITION SYSTEM
    MADAN, A
    RAVA, P
    SCHROPP, REI
    VONROEDERN, B
    APPLIED SURFACE SCIENCE, 1993, 70-1 (1 -4 pt B) : 716 - 721
  • [10] Diffusion and oxidation of plasma-enhanced chemical-vapor-deposition silicon nitride and underlying metals
    Han, GC
    Luo, P
    Li, KB
    Wu, YH
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 2001, 19 (03): : 793 - 797