DICHROMETER FOR STUDYING FREE-CARRIER DENSITY IN SEMICONDUCTORS

被引：0
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作者：
POTIKHONOV, GN
GALANOV, EK
LEIKIN, MV
KOSTROV, ID
机构：
来源：
SOVIET JOURNAL OF OPTICAL TECHNOLOGY | 1981年 / 48卷 / 02期
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中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
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页码：80 / 81
页数：2
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