共 50 条
- [1] Initial oxidation processes of H-terminated Si(100) surfaces studied by high-resolution electron energy loss spectroscopy JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1996, 35 (2B): : 1069 - 1072
- [2] Initial oxidation processes of H-terminated Si(100) surfaces studied by high-resolution electron energy loss spectroscopy Jpn J Appl Phys Part 1 Regul Pap Short Note Rev Pap, 2 B (1069-1072):
- [3] Orientation dependence of the initial oxidation of H-terminated Si surfaces studied by high-resolution electron energy loss spectroscopy PHYSICS AND CHEMISTRY OF SIO(2) AND THE SI-SIO(2) INTERFACE-3, 1996, 1996, 96 (01): : 72 - 80
- [5] HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY STUDIES OF GAAS (100) SURFACES JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (04): : 1113 - 1118
- [6] Initial oxidation of Si(311) surfaces studied by high-resolution electron energy loss spectroscopy Applied Surface Science, 1996, 100-101 : 431 - 435
- [10] ELECTRON-ENERGY LOSS SPECTROSCOPY OF H-TERMINATED SI(111) AND SI(100) PREPARED BY CHEMICAL ETCHING JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1992, 10 (04): : 2160 - 2165