CONTRAST MECHANISM OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY

被引：1

作者：

YAMAMOTO, T ^{[1
]}

机构：

[1] JEOL LTD,TOKYO,JAPAN

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1977年 / 43卷 / 01期

关键词：

D O I：

10.1002/pssa.2210430155

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K53 / K56

页数：4

共 50 条

[1] ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY
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[2] EXPERIMENTAL ASPECTS OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY .1. MEASUREMENT OF CONTRAST
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[3] EXPERIMENTAL ASPECTS OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY .2. ESTIMATION OF CONTRAST DEPTH
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[4] THEORETICAL MODEL FOR ENERGY-DEPENDENCE OF ELECTRON CHANNELING PATTERNS IN SCANNING ELECTRON-MICROSCOPY
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[9] MEASUREMENT OF CONTRAST CHANGES IN SCANNING ELECTRON-MICROSCOPY
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