CHARACTERIZATION OF HG1-XCDXTE HETEROSTRUCTURES BY THERMOELECTRIC MEASUREMENTS

被引:5
|
作者
BAARS, J [1 ]
BRINK, D [1 ]
EDWALL, DD [1 ]
BUBULAC, LO [1 ]
机构
[1] ROCKWELL INT CORP,CTR SCI,THOUSAND OAKS,CA 91360
关键词
AS DOPING; HGCDTE; IN DOPING; MOCVD; SIMS; THERMOELECTRIC EFFECTS;
D O I
10.1007/BF02817506
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
P-on-n mercury cadmium telluride (MCT) heterostructures grown by MOCVD with As and In as n- and p-type dopants, respectively, are examined by measuring the Seebeck and Hall coefficients between 20 and 320K. The results are analyzed regarding doping and composition of the layers by least squares fitting the experimental profiles with the calculated temperature dependencies. The electron and hole densities of the layers are calculated taking into account Fermi-Dirac statistics, a nonparabolic conduction band, a parabolic valence band, a discrete acceptor level, and fully ionized donors. For the Seebeck coefficient, the relation we previously showed to be valid for p-type MCT1 is used. This relation relies on the thermoelectric effect in a temperature gradient resulting from the diffusion of nondegenerate carriers scattered by LO-phonons. It also fits the observed thermoelectric properties of n-type MCT in a wide temperature range. The doping and structural parameters determined from the thermoelectric measurements agreed very well with As and In profiles obtained from secondary ion mass spectroscopy measurements and the data obtained from analyses of infrared transmission measurements.
引用
收藏
页码:923 / 929
页数:7
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