TUNNELING-STABILIZED MAGNETIC FORCE MICROSCOPY OF BIT TRACKS ON A HARD DISK

被引：22
|
作者：
RICE, P
MORELAND, J
机构：
[1] Superconductor and Magnetic Measurements Group, Electromagnetic Technology Division, National Institute of Standards and Technology, Boulder
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1991年 / 27卷 / 03期
关键词：
D O I：
10.1109/20.79082
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A scanning tunneling microscope (STM) for surface magnetic force measurements on thin-film longitudinal magnetic storage media has been adapted. The usual rigid PtIr tip of the STM was replaced by a flexible Fe film tip. Images of a hard disk showing bit tracks written by a ferrite head in a computer disk drive are presented. The images shown are comparable to images of the bit tracks on textured surfaces using either ferrofluid decoration or other magnetic force microscopy (MFM) imaging techniques. The sensitivity of the Fe film tip was such that the influence on the image due to magnetic forces was larger than the influence due to sample surface topography.
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页码：3452 / 3454
页数：3
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