PHOTOELECTRON MICROSCOPY FROM MAGNETIC-MATERIALS

被引:3
|
作者
KACHEL, T [1 ]
HOLLDACK, K [1 ]
GUDAT, W [1 ]
NEUBER, M [1 ]
WILDE, C [1 ]
机构
[1] UNIV HEIDELBERG,INST APPL PHYS CHEM,HEIDELBERG,GERMANY
来源
JOURNAL DE PHYSIQUE IV | 1994年 / 4卷 / C9期
关键词
D O I
10.1051/jp4:1994972
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Synchrotron radiation based photoelectron microscopy is discussed. We show that the spectromicroscope ESCASCOPE together with circularly polarized VUV radiation can be used to measure magnetic domains with 10 mu m resolution, The high element specifity of the setup allows to detect domains in monoatomic overlayers and to distinguish them from the substrate domain structure.
引用
收藏
页码:439 / 444
页数:6
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