A TECHNIQUE TO MEASURE THE DYNAMIC-RESPONSE OF A-SI-H THIN-FILM TRANSISTOR-CIRCUITS

被引：1

作者：

BASHIR, R

NEUDECK, GW

机构：

[1] School of Electrical Engineering Purdue University W., Lafayette

来源：

SOLID-STATE ELECTRONICS | 1990年 / 33卷 / 07期

关键词：

D O I：

10.1016/0038-1101(90)90082-P

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

[No abstract available]

引用

页码：973 / 974

页数：2

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