ROLES OF ATOMIC-HYDROGEN IN CHEMICAL ANNEALING

被引:112
|
作者
NAKAMURA, K
YOSHINO, K
TAKEOKA, S
SHIMIZU, I
机构
[1] Tokyo Institute of Technology, The Graduate School, Yokohama, Kanagawa, 226, 4259 Nagatsuta, Midori-ku
关键词
AMORPHOUS SILICON; HYDROGEN PLASMA; ATOMIC HYDROGEN; CHEMICAL ANNEALING; STRUCTURAL RELAXATION;
D O I
10.1143/JJAP.34.442
中图分类号
O59 [应用物理学];
学科分类号
摘要
A systematic study has been performed to reveal the role of atomic hydrogen in chemical annealing, where the deposition of a thin layer and treatment with atomic hydrogen are repeated alternately, for the fabrication of a stable structure. Structural relaxation resulting from impingement of atomic hydrogen on the growing surface is differentiated into two processes: the structural promoted relaxation on the surface and changes caused within the sub-surface depending on the conditions for deposition of the thin laver and the Au?c of atomic hydrogen. The structural changes within the sub-surface resulted in either the widening of the optical gap or crystallization at rather low substrate temperatures (T-s: 100-150 degrees C). High-quality a-Si:H with the optical gap of 1.87 eV exhibiting rather high stability against light soaking was successfully fabricated by this technique. The defect density of the film was 4 x 10(15) cm(-3) in its well annealed state and 6 x 10(16) cm(-3) in the saturated state. At high T-s, on the other hand. the hydrogen treatment mainly enhanced chemical activities of the growing surface and resulted in either narrowing of the optical gap or promotion of the grain growth.
引用
收藏
页码:442 / 449
页数:8
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