CORRELATION BETWEEN NOISE-AFTER-WRITE AND MAGNETIZATION DYNAMICS IN THIN-FILM HEADS

被引：6
|
作者：
LIU, FH
RYAN, P
SHI, X
KRYDER, MH
机构：
[1] Data Storage Systems Center, Carnegie Mellon University, Pittsburgh, PA
[2] Seagate Technology, Minneapolis, MN
来源：
IEEE TRANSACTIONS ON MAGNETICS | 1992年 / 28卷 / 05期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1109/20.179409
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Correlation between noise-after-write and magnetization dynamics in 30-turn electroplated thin film heads has been investigated by utilizing two complementary magneto-optic Kerr effect domain imaging systems and a Barkhausen noise tester. It has been found that heads containing spike-like domains near the backgap closure have significantly higher noise-after-write rates than heads with normal closure domain configurations. A longitudinal 180-degrees wall in the direction of flux conduction at the sloped region of the pole tip was observed, however, independent of whether the head had a high or low noise-after-write rate.
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页码：2100 / 2102
页数：3
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