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- [5] TECHNIQUE OF SURFACE CHARACTERIZATION FOR SECONDARY ELECTRON EMISSION MEASUREMENTS DURING POSITIVE ION BOMBARDMENT BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1971, 16 (08): : 837 - &
- [6] Secondary emission from copper due to slow positive ions of argon PROCEEDINGS OF THE PHYSICAL SOCIETY, 1936, 48 : 830 - 838
- [10] Secondary electron emission from a hot nickel target due to bombardment by hydrogen ions PHYSICAL REVIEW, 1936, 49 (12): : 0925 - 0930