STEP-AND-REPEAT WAFER IMAGING

被引:0
|
作者
WITTEKOEK, S
机构
关键词
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:80 / 84
页数:5
相关论文
共 50 条
  • [1] STEP-AND-REPEAT WAFER IMAGING
    ROUSSEL, J
    SOLID STATE TECHNOLOGY, 1978, 21 (05) : 67 - 71
  • [2] STEP-AND-REPEAT WAFER IMAGING.
    Roussel, Jeanne
    1600, (21):
  • [3] STEP-AND-REPEAT CAMERA
    ALLES, DS
    ELEK, JW
    HOWLAND, FL
    NEVIS, B
    NIELSEN, RJ
    SCHLEGEL, WA
    SKINNER, JG
    STOUT, CE
    BELL SYSTEM TECHNICAL JOURNAL, 1970, 49 (09): : 2145 - +
  • [4] WAFER FLATNESS AS A CONTRIBUTOR TO DEFOCUS AND TO SUBMICRON IMAGE TOLERANCES IN STEP-AND-REPEAT PHOTOLITHOGRAPHY
    UNDERHILL, JA
    SUNDLING, DL
    KERBAUGH, ML
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 299 - 303
  • [5] IMPROVEMENT OF OVERLAY AND FOCUSING ACCURACY OF WAFER STEP-AND-REPEAT ALIGNERS BY AUTOMATIC CALIBRATION
    MAYER, HE
    LOEBACH, EW
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 470 : 178 - 184
  • [6] WAFER ALIGNMENT MARK POSITION-DETECTING TECHNIQUE FOR STEP-AND-REPEAT PROJECTION ALIGNERS
    AKIYAMA, N
    YAMAUCHI, Y
    BULLETIN OF THE JAPAN SOCIETY OF PRECISION ENGINEERING, 1989, 23 (03): : 200 - 204
  • [7] Upgrading of an approved wafer stepper: The AUER-2 automatic step-and-repeat aligner
    Graichen, Winfried
    Lahne, Bernad
    Weiland, Eberhard
    Jena Review, 1988, 33 (01): : 26 - 28
  • [8] ADVANCES IN DIGITAL ALIGNMENT STRATEGIES FOR STEP-AND-REPEAT OPTICAL IMAGING.
    Elliott, D.J.
    Fish, Roger
    Gottier, Nancy
    Mason, Mark
    Sparkes, Chris
    Microelectronic Engineering, 1985, 3 (1-4) : 261 - 265
  • [9] Step-and-scan and step-and-repeat, a technology comparison
    vandenBrink, M
    Jasper, H
    Slonaker, S
    Wijnhoven, P
    Klaassen, F
    OPTICAL MICROLITHOGRAPHY IX, 1996, 2726 : 734 - 753
  • [10] AN ANALYSIS OF PELLICLE PARAMETERS FOR STEP-AND-REPEAT PROJECTION
    FLAMHOLZ, A
    PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS, 1984, 470 : 138 - 146