A METHODOLOGY FOR OPTIMAL TEST STRUCTURE DESIGN FOR STATISTICAL PROCESS CHARACTERIZATION AND DIAGNOSIS

被引：0
|
作者：
CHEN, I
STROJWAS, AJ
机构：
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1987年 / 6卷 / 04期
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中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
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页码：592 / 600
页数：9
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