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- [4] PHYSICAL FACTORS AFFECTING INVESTIGATION OF NON-METALS BY MEANS OF PHOTOEMISSION ELECTRON-MICROSCOPY OPTIK, 1976, 45 (04): : 333 - 343
- [9] Sputter yield measurements of thin foils using scanning transmission ion microscopy The European Physical Journal D, 2015, 69
- [10] Sputter yield measurements of thin foils using scanning transmission ion microscopy EUROPEAN PHYSICAL JOURNAL D, 2015, 69 (01): : 1 - 7