PROBLEMS IN X-RAY-EMISSION SPECTROSCOPY

被引：1
|
作者：
CHAPMAN, JN
机构：
来源：
ULTRAMICROSCOPY | 1989年 / 28卷 / 1-4期
关键词：
D O I：
10.1016/0304-3991(89)90275-1
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
收藏
页码：76 / 78
页数：3
相关论文
共 50 条
  • [1] CURRENT PROBLEMS IN X-RAY-EMISSION SPECTROSCOPY
    GOLDSTEIN, JI
    WILLIAMS, DB
    LYMAN, CE
    [J]. ULTRAMICROSCOPY, 1989, 28 (1-4) : 56 - 60
  • [2] X-RAY-EMISSION SPECTROSCOPY
    FORSTER, E
    FILL, EE
    GABEL, K
    HE, H
    MISSALLA, T
    RENNER, O
    USCHMANN, I
    WARK, J
    [J]. JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER, 1994, 51 (1-2): : 101 - 111
  • [3] POLARIZED X-RAY-EMISSION SPECTROSCOPY
    LINDLE, DW
    COWAN, PL
    JACH, T
    LAVILLA, RE
    DESLATTES, RD
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1989, 40-1 : 257 - 261
  • [4] X-RAY-EMISSION SPECTROSCOPY .1.
    VALKOVIC, V
    [J]. CONTEMPORARY PHYSICS, 1973, 14 (05) : 415 - 438
  • [5] THEORY OF X-RAY-EMISSION AND PHOTOEMISSION COINCIDENCE SPECTROSCOPY
    TANAKA, S
    KOTANI, A
    [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1992, 61 (11) : 4212 - 4221
  • [6] X-RAY-EMISSION SPECTROSCOPY OF INDUSTRIAL CATALYSTS IN THE STEM
    LYNCH, J
    [J]. JOURNAL DE PHYSIQUE, 1984, 45 (NC-2): : 701 - 704
  • [7] SENSITIVITY LIMITS IN X-RAY-EMISSION SPECTROSCOPY OF CATALYSTS
    DEXPERT, H
    LYNCH, JP
    FREUND, E
    [J]. INSTITUTE OF PHYSICS CONFERENCE SERIES, 1982, (61): : 171 - 174
  • [8] CHARACTERIZATION OF TINX COATINGS BY X-RAY-EMISSION SPECTROSCOPY
    BEAUPREZ, E
    HAGUE, CF
    MARIOT, JM
    TEYSSANDIER, F
    [J]. JOURNAL DE MICROSCOPIE ET DE SPECTROSCOPIE ELECTRONIQUES, 1986, 11 (04): : 251 - 254
  • [9] APPLICATION OF HIGH-RESOLUTION X-RAY-EMISSION SPECTROSCOPY TO PROBLEMS RELATED TO MINERALS
    SCHULENBURG, M
    KNIPPING, U
    FREUND, F
    [J]. FORTSCHRITTE DER MINERALOGIE, 1982, 60 (01): : 101 - 115
  • [10] RESONANT X-RAY-EMISSION SPECTROSCOPY IN DY COMPOUNDS
    TANAKA, S
    OKADA, K
    KOTANI, A
    [J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1994, 63 (07) : 2780 - 2787
12345