SINGLE-ATOM POINT-SOURCE FOR ELECTRONS - FIELD-EMISSION RESONANCE TUNNELING IN SCANNING-TUNNELING-MICROSCOPY

被引:27
|
作者
GADZUK, JW
机构
[1] National Institute of Standards and Technology, Gaithersburg
来源
PHYSICAL REVIEW B | 1993年 / 47卷 / 19期
关键词
D O I
10.1103/PhysRevB.47.12832
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Many years ago spectroscopic evidence based on a single-electron process, namely, field-emission resonance tunneling, was reported showing the electronic structure of single atoms adsorbed on metal surfaces. Huge enhancements in the highly collimated tunneling current through the virtual states of the adparticle made the single-atom spectroscopy feasible when the field-emission spectrometer was operated in the ''probe-hole mode.'' A related effect is currently popular in today's scanning tunneling microscopy and also in nanometer-cluster spectroscopy. The phenomenology and theory of the effect is presented and the current activity is considered in light of what has been uncovered in the field-emission work.
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页码:12832 / 12839
页数:8
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